XYZ 500 Test Positioners with Micrometers

These micropositioners are intended for probing applications in the testing and analysis of silicon wafers, substrates, and dies in the semiconductor industry. It provides 3-axis motion with .500" movement on each axis. Motion is controlled by three micrometer heads available with .01mm resolution. Precision high-quality 440 stainless steel ball bearings allow precise linear motion on all three axis. Gibs and Slides are made of 440 stainless steel. Slide bases are made of aluminum anodized black. A test positioners comes complete with magnetic base, short test arm holder and a test arm setup with a needle to do DC probing.

The XYZ 500 Test micropositioner with micrometers is available also in a left hand and right hand model. The test micropositioner is used for industrial, medical, biological, semiconductor, and general scientific applications. There are many front end options available to adapt to various testing applications. These translation stages are available in any combination of XYZ or just X and Y.

Specifications for XYZ 500 Micropositioner with Micrometers

Height: 4.00"
Weight: Shipping weight less than 2 lb.
Base footprint: 1.50" X 2.00"
Travel: X, Y, Z axis = .500"
Resolution: .01 mm per marking on the micrometers

The XYZ 500 TIM test positioners are assembled with the following parts

• XYZ 500 MIM
• 20232 Magnetic Base
• 20249 Test Arm Holder other lengths are available
• 20235 Test Arm
• 20242 Test Needle
• 20241 Insulator
• 20260 Connecting Pin

Key Benefits

• Available measurements in relative point to point moves
• Bearings for precise movement
• Stable unit
• Upgradeable